## Sheet resistance measurements The first three methods are all based on [[Ohm's law and Hall effect#Ohm's law in semiconductor devices|Ohm's law]], and very similar. ### Four-point probe ### Van der Pauw method Include a test structure sketch. ### Transfer length measurements Include a test structure sketch. ### Hall bar Include a test structure sketch. See [[Ohm's law and Hall effect]] and [[Drude model with magnetic field]].